| Customization: | Available |
|---|---|
| Structure: | Metal Base Rigid PCB |
| Dielectric: | Al |
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Higher thermal conductivity (T.C.)than common CCL,efficiently prolong life span of electronic products.
| Item | Test Method | Unit | FW806 | FW808 | FW810 | FW815 | FW820 |
| 0.6W | 0.8W | 1.0W | 1.5W | 2.0W | |||
| Dielectric layer thickness | After slicing, measure under microscope | μm | 110-130 | 110-130 | 110-130 | 110-130 | 110-130 |
| Thermal stress | 288ºC±5ºC(180s) , | SEC | ≥120 | ≥120 | ≥120 | ≥120 | ≥120 |
| Peel Strength | IPC-TM-650-2.4.8.1 | N/mm | >1.0 | >1.0 | >1.0 | >1.0 | >1.0 |
| Leakage voltage | 50mm,current≤5mA | KV | AC≥3 | AC≥3 | AC≥3 | AC≥3 | AC≥3 |
| 50mm, current≤0.5mA | KV | DC≥4 | DC≥4 | DC≥5 | DC≥5 | DC≥5 | |
| Breakdown Voltage | IPC-TM-650-2.5.6 | KV | AC≥5 | AC≥5 | AC≥5 | AC≥5 | AC≥5 |
| TG(DSC) | IPC-TM-650-2.4.25 | ºC | >130 | >130 | >130 | >130 | >130 |
| (TMA) | IPC-TM-650-2.4.24 | %(50~260ºC) | 0.5 | 0.5 | 0.5 | 0.5 | 0.5 |
| Thermal Conductivity | Thermal conductivity tester | W/(M.K) | >0.6 | >0.8 | >1.0 | >1.3 | >1.7 |
| Thermal Resistance | Thermal conductivity tester | ºC/W | <0.8 | <0.7 | <0.55 | <0.5 | <0.4 |
| Copper Foil | After slicing, measure under microscope | μm | 15±2,18±2,22±2,25±2, 33±3,35±3,70±6 |
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| Product thickness | External Micrometer | mm | (thickness)0.6-2.0 (Tolerance):≥-0.12 | ||||
| Aluminum Substrate | / | / | (Aluminum grade): 1060/5052 | ||||
| Features | |||||||
| 1.(CCL), | |||||||
| Higher thermal conductivity (T.C.)than common CCL,efficiently prolong life span of electronic products. | |||||||
| 2.;Superior machnical properties | |||||||
| 3.Applications:LED, LED based lightings,backlights,etc. | |||||||